Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...
JACKSONVILLE, Fla., July 27, 2023 (GLOBE NEWSWIRE) -- Duos Technologies Group, Inc. (DUOT) (“Duos” or the “Company”) (Nasdaq: DUOT), through its operating subsidiary Duos Technologies, Inc., a ...
Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
Active Learning to Reduce Data Requirements For Defect Identification in Semiconductor Manufacturing
A new technical paper titled “Exploring Active Learning for Semiconductor Defect Segmentation” was published by researchers at Agency for Science, Technology and Research (A*STAR) in Singapore. “We ...
To improve the performance of SiC, numerous studies of the formation and the propagation of defects during crystal growth have been carried out. Though the results have resulted in major advancements ...
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