Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

Tokyo — Using low-temperature, ultrasonic measurements, researchers here have developed a way to directly observe atomic vacancies in the silicon crystal of an ingot. The breakthrough, achieved in a ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

With typical lot sizes of 25 wafers and finished wafer values ranging from $4,000 to $17,000, depending on complexity, a ...

“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...

Onto has received multiple orders in support of high bandwidth memory (HBM), advanced logic and a variety of specialty segments WILMINGTON, Mass.--(BUSINESS WIRE)--Onto Innovation Inc. (NYSE: ONTO) ...

Silicon carbide (SiC) has arrived, and it’s a big deal. It was written all over APEC 2023 show with a string attached: the cost of a SiC device is significantly higher than its silicon counterpart.

Now, WaferWeight allows fabs to track wafer mass quickly, accurately, and economically – concurrently with macro defect inspection. Our EAGLEview can do defect inspection and wafer weighing both at ...