Semiconductor Engineering

Modulated Electron Microscopy Applied In The Process Monitoring Of Memory Cell And The Defect Inspection Of Floating Circuits

A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA ...
Business Wire

OmniVision Announces World’s First Dedicated Driver Monitoring System ASIC With Integrated AI Neural Processing Unit, Image Signal Processor and DDR3 Memory

SANTA CLARA, Calif.--(BUSINESS WIRE)--OmniVision Technologies, Inc., a leading developer of advanced digital imaging solutions, today announced in advance of CES the OAX8000 AI-enabled, automotive ...
Nature

Three-dimensional integration of nanotechnologies for computing and data storage on a single chip

Physical device scaling of traditional silicon metal–oxide–semiconductor field-effect transistors (MOSFETs) has driven progress in computing for decades 6; however, continued scaling is becoming ...
EurekAlert!

Precision empowerment for brain "eavesdropping": CAS team develops triple-electrode integrated functional electrode for simultaneous monitoring of neural signals and chemical ...

Understanding the dynamic neural mechanisms of sleep-wake cycles is a major challenge in sleep science and neuroengineering. Sleep, essential for maintaining brain homeostasis and cognitive function, ...