Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
In this week’s episode of The Logic Pros, we are continuing our tour of some of Logic’s most powerful in-house effects and tools. Delay FX are one of the most commonly used and versatile options in ...
The end goal of database design is to be able to transform a logical data model into an actual physical database. A logical data model is required before you can even begin to design a physical ...