Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

As technology nodes shrink, end users are designing systems where each chip element is being targeted for a specific technology and manufacturing node. While designing chip functionality to address ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

WEST LAFAYETTE, Ind. — A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car’s steering to making your laptop ...

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting ...

Researchers can now detect the formation of keyhole pores, one of the most challenging defects common in additive manufacturing, with incredible accuracy. A research team led by Tao Sun, associate ...