Tech Xplore on MSN
Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
The areas of semiconductor test, inspection, and related technologies have seen considerable innovation during the second half of 2017. With regard to test, traditional ATE companies introducing new ...
FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Semiconductor test equipment supplier Advantest announced that its recently launched ACS Real-Time Data Infrastructure (RTDI) has been accepted by multiple major data-analytics companies. The ...
AUSTIN, Texas--(BUSINESS WIRE)--NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today the ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback