TMCnet

PI Introduces Miniaturized Alignment Engine Platform for Scalable, Parallel E/O Wafer-Level Test

Parallel piezo aligners with fly height sensors enable faster PIC wafer testing.
Joplin Globe

Teradyne Announces Production System for Double-Sided Wafer Probe Test for Silicon Photonics

Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the ...
Nasdaq

Aehr Announces New Advanced Testing Capabilities on its FOX-P™ Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies

FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released ...
Seeking Alpha

Aehr Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide MOSFETs

FREMONT, Calif., Sept. 18, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Semiconductor Engineering

Hunting For Macro Defects

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
KXAN

Global Wafer Test Probe Card Market to reach USD 3.88 billion by 2028

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...