Scan a form to put on a computer for others to use as a sample when completing a physical version of the form. If you scan a form to a computer without marking it as a sample, others may print and use ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Measuring magnetic fields inside samples has only been possible indirectly up to now. Magnetic orientations can be scanned with light, X-rays, or electrons - but only on the surfaces of materials.

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

Inelastic light scattering on a sample is measured by Raman spectroscopy. The Raman spectrum is unique to each IR-active substance, and thus, allows for clear identification of the substance of ...

A CT scan technique that splits a full X-ray beam into thin beamlets can deliver the same quality of image at a much reduced radiation dose, according to a new study. The technique, demonstrated on a ...

Engineers have designed an atomic force microscope that scans images 2,000 times faster than existing commercial models. With this new high-speed instrument, the team produced images of chemical ...

Rigaku CT Lab GX is a micro-CT (computed tomography) scanner. The sample stays stationary as on a medical CT scanner, making it easy to mount samples with a complex shape or ones connected to in-situ ...