When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Designing circuit boards for high speed applications requires special considerations. This you already know, but what exactly do you need to do differently from common board layout? Building on where ...
Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...
Among many deliberations when designing with high-speed analog-to-digital converters (ADCs), the effect of the ADC’s sampling clock is paramount to meeting specific design requirements. There are ...
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