Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

The team developed an off-axis bright- and dark-field OCT system with a custom-designed high-precision objective lens. By ...

Triply-twinned body-centred cubic lattices shift strut-scale deformation from bending to stretching, producing major gains in ...

Defect engineering is the deliberate introduction, removal, or manipulation of structural imperfections in nanomaterials to tailor their properties for specific applications. Unlike the traditional ...

Chinese researchers developed an all-perovskite tandem solar cell using a non-contact laser polishing strategy that reduces surface defects and improves charge extraction in lead-tin perovskite films.

A new research review looks at how computer vision and machine learning could be used to spot defects in 3D printed concrete.

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...